An efficient algorithm to calculate relative permittivity from multi-layered stripline based measurements at microwave frequencies

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dc.contributor.authorGunawardena, A.U.A.W.
dc.date.accessioned2026-07-09T15:35:57Z
dc.date.issued2018
dc.identifier.citationJournal of the National Science Foundation of Sri Lanka, 46(1):p.103-108
dc.identifier.urihttp://doi.org/10.4038/jnsfsr.v46i1.8270
dc.identifier.urihttps://viduketha.nsf.gov.lk/handle/123456789/442
dc.language.isoEnglish
dc.publisherNational Science Foundation:Colombo
dc.subjectEngineering & Technology
dc.subjectDielectric measurement
dc.subjectMulti-layer
dc.subjectNewton Raphson
dc.subjectPermittivity
dc.titleAn efficient algorithm to calculate relative permittivity from multi-layered stripline based measurements at microwave frequencies
dc.typeArticle

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