An efficient algorithm to calculate relative permittivity from multi-layered stripline based measurements at microwave frequencies

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Date

2018

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National Science Foundation:Colombo

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Keywords

Engineering & Technology, Dielectric measurement, Multi-layer, Newton Raphson, Permittivity

Citation

Journal of the National Science Foundation of Sri Lanka, 46(1):p.103-108

URI

http://doi.org/10.4038/jnsfsr.v46i1.8270
 https://viduketha.nsf.gov.lk/handle/123456789/442

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Journal of the National Science Foundation of Sri Lanka (JNSF)

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