Temperature dependent X-ray diffraction studies of SnO thin films

dc.contributor.authorPriyantha, W.A.A.
dc.contributor.authorVithanage, C.R.
dc.contributor.authorJayanetti, J.K.D.S.
dc.contributor.authorDe Silva, K.T.L.
dc.date.accessioned2026-07-14T08:35:45Z
dc.date.issued1997
dc.identifier.urihttp://vidya.nsf.gov.lk:8080/pdfs/vidslaas/1997/E112.pdf
dc.identifier.urihttps://viduketha.nsf.gov.lk/handle/123456789/15276
dc.language.isoEnglish
dc.publisherProceedings of the 53rd Anuual Session,Part 1 - Abstracts
dc.subjectPhysical Sciences
dc.subject-
dc.titleTemperature dependent X-ray diffraction studies of SnO thin films
dc.typeArticle

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