Effects of residual gas pressure on the mass resolution and the molecular ion yield of a time-of-flight mass spectrometer
| dc.contributor.author | Piyadasa, C.K.G.,Department of Physics.University of Colombo,Colombo 3 | |
| dc.contributor.author | Ariyaratne, T.R.,Department of Physics.University of Colombo,Colombo 3 | |
| dc.contributor.author | Wijayaratna, W.M.K.P.,Department of Physics.University of Colombo,Colombo 3 | |
| dc.date.accessioned | 2026-07-14T08:02:44Z | |
| dc.date.issued | 1996 | |
| dc.identifier.uri | http://vidya.nsf.gov.lk:8080/pdfs/vidslaas/1996/E117.pdf | |
| dc.identifier.uri | https://viduketha.nsf.gov.lk/handle/123456789/14900 | |
| dc.language.iso | English | |
| dc.publisher | Proceedings of the 52th Anuual Session,Part 1 - Abstracts | |
| dc.subject | Physical Sciences | |
| dc.subject | - | |
| dc.title | Effects of residual gas pressure on the mass resolution and the molecular ion yield of a time-of-flight mass spectrometer | |
| dc.type | Article |