Comparison of interface properties of post-treated p-Cu2O/Au Schottky junctions

dc.contributor.authorKafi, F.S.B.,Department of Physics.University of Kelaniya,Kelaniya
dc.contributor.authorJayathilaka, K.M.D.C.,Department of Physics.University of Kelaniya,Kelaniya
dc.contributor.authorWijesundera, L. B.D.R.P.,Department of Physics.University of Kelaniya,Kelaniya
dc.contributor.authorSiripala, W.P.,Department of Physics.University of Kelaniya,Kelaniya
dc.date.accessioned2026-07-15T03:34:55Z
dc.date.issued2017
dc.identifier.urihttp://vidya.nsf.gov.lk:8080/pdfs/vidslaas/2017/506E1.pdf
dc.identifier.urihttps://viduketha.nsf.gov.lk/handle/123456789/18327
dc.language.isoEnglish
dc.publisherSri Lanka Association for the Advancement of Science Proceedings of the 73rd Annual Sessions – 2017
dc.subjectPhysical Science
dc.subject-
dc.titleComparison of interface properties of post-treated p-Cu2O/Au Schottky junctions
dc.typeArticle

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